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For more demanding applications
useful for EDX analysis
For non-electrical applications where wear resistance is required
PtIr Conductive Coating
Recommended for use with Bruker Dimension FastScan AFM
Test Grating for Tip Sharpness Hysitron For more demanding applicationsDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
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